Browsing by Author "Ufer, K."

Browsing by Author "Ufer, K."

Sort by: Order: Results:

  • Clays and Clay Minerals, Vol. 56, No. 2, 272–282, 2008. 
    Ufer, K.; Stanjek, H.; Roth, G.; Dohrmann, R.; Kleeberg, R.; Kaufhold, S. (The Clay Minerals SocietyThe Clay Minerals Society, 2008)
    Thirty six bentonite samples from 16 different locations were examined in order to demonstrate the applicability of a new Rietveld description approach for quantitative phase analysis. X-ray diffraction patterns of the ...
  • Clays and Clay Minerals, Vol. 57, No. 6, 686–694, 2009. 
    Dohrmann, R.; Ruping, K.B.; Kleber, M.; Ufer, K.; Jahn, R. (The Clay Minerals Society, 2009)
    In X-ray diffraction (XRD) analysis, preparation of oriented clay specimens enhances their 00l reflections by arranging basal surfaces parallel to the specimen surface. In one-dimensional modeling of XRD intensities, degree ...