Ufer, Kristian; Kleeberg, Reinhard; Bergmann, Jorg; Dohrmann, Reiner
(The Clay Minerals SocietyThe Clay Minerals Society, 2012)
X-ray diffraction patterns of oriented mounts of clay minerals are often used in clay mineralogy for qualitative and quantitative purposes. Fequently occurring stacking defects, in particular, can be characterized by this ...